首页 | 本学科首页   官方微博 | 高级检索  
     检索      

Tween80/AEO20体系胶束形成的分子间相互作用
引用本文:汤晓露,王仲妮,周武.Tween80/AEO20体系胶束形成的分子间相互作用[J].聊城大学学报(自然科学版),2011(4):76-80.
作者姓名:汤晓露  王仲妮  周武
作者单位:山东师范大学化学化工与材料科学学院农药医药中间体清洁生产教育部工程技术中心
基金项目:国家自然科学基金资助项目(31071603)
摘    要:用wilhelmy吊片法研究了油烯基聚氧乙烯(20)醚(AEO20)/Tween80混合体系的平衡表面张力.探讨了温度对其平衡表面张力的影响,计算了混合体系的表面活性(CMC,γCMC,Γmax,Amin,pC20),并进一步用Clint和Rubingh理论探讨该混合体系在胶束形成过程中的分子间相互作用参数βm,分子交...

关 键 词:表面活性剂混合体系  表面张力  表面活性剂相互作用参数(β)  分子交换能(εm)

Molecule Interaction in Mixed Micelle Formed by Oleyl Polyoxyethylene(20) and Tween80 System
TANG Xiao-lu WANG Zhong-ni ZHOU Wu.Molecule Interaction in Mixed Micelle Formed by Oleyl Polyoxyethylene(20) and Tween80 System[J].Journal of Liaocheng University:Natural Science Edition,2011(4):76-80.
Authors:TANG Xiao-lu WANG Zhong-ni ZHOU Wu
Institution:TANG Xiao-lu WANG Zhong-ni ZHOU Wu(School of Chemistry,Chemical Engineering and Materials Science,Shandong Normal University, Engineering Research Center of Pesticide and Medicine Intermediate Clean Production,Jinan 250014,China)
Abstract:The surface tension of oleyl polyoxyethylene(20)(AEO20)with Tween80 was determined by a Wilhelmy type surface tension-meter.The influence of temperature on equilibrium surface tension was studied.The interactions between the two surfactant molecules in mixed micelle were studied through CMC,γCMC,pC20,Γmax,Amin.Moreover Clint’s and Rubingh’s treatments were used to analyze the molecular interaction parameters(βm) and the molecule exchange energy(εm).For systems investigated,it showed that surface activity was advanced.There was a stronger synergistic mixing behaviour between AEO20 and Tween80 in some conditions.At 25℃ all mixtures showed synergism most evidently.At 30℃ and 35℃,when αAEO20< 0.50 mixtures showed negative deviation,while βm and εm values of the mixed micelles ranged-1.84 and-12.47,-0.51 kJ/mol and-5.32 kJ/mol for all mixtures investigated.
Keywords:surfactant mixtures  surface tension  molecular interaction parameters(βm)  molecule exchange energy(εm)
本文献已被 CNKI 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号