| Z-扫描技术测量(Na0.5Bi0.5)TiO3薄膜非线性折射率 |
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| 引用本文： | 张婷,何家梅,丁玲红,张伟风.Z-扫描技术测量(Na0.5Bi0.5)TiO3薄膜非线性折射率[J].河南大学学报(自然科学版),2007,37(1):14-17. |
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| 作者姓名： | 张婷 何家梅 丁玲红 张伟风 |
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| 作者单位： | 1. 河南大学,物理与电子学院,河南,开封,475001
2. 郑州经济干部管理学院,电信工程系,河南,郑州,450052 |
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| 基金项目： | 河南省高等学校创新人才培养工程项目 |
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| 摘 要： | 描述了一种重要的测量多种物质的光学非线性折射率的单光束Z-扫描测试技术,被测样品放置于汇聚高斯光束的光轴(Z轴)上,样品在焦点附近沿Z轴移动,在远场处放置带有小孔的屏,通过测量样品的透过率与样品位置的关系,即可得到材料的非线性折射率.利用此技术,测量了(Na0.5Bi0.5)TiO3薄膜样品的非线性折射率.
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| 关 键 词： | Z-扫描技术 非线性折射率 (Na0.5Bi0.5)TiO3薄膜 |
| 文章编号： | 1003-4978（2007）01-0014-04 |
| 修稿时间： | 2006-09-16 |
The Measurement of Optical Nonlinear Refraction Index of (Na0.5Bi0.5)TiO3 Thin Films Using a Z-scan Technique |
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| ZHANG Ting,HE Jia-mei,DING Ling-hong,ZHANG Wei-feng.The Measurement of Optical Nonlinear Refraction Index of (Na0.5Bi0.5)TiO3 Thin Films Using a Z-scan Technique[J].Journal of Henan University(Natural Science),2007,37(1):14-17. |
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| Authors: | ZHANG Ting HE Jia-mei DING Ling-hong ZHANG Wei-feng |
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| Institution: | 1. School of Physics and Electronics, Henan University, Henan Kai f eng 475001 ,China; 2. Department of Electronic Information and Engineering, Zhengzhou Economic Management Institute, Zhengzhou 450052, China |
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| Abstract: | The paper described a sensitive single beam Z-scan technique for measurement of the optical nonlinear refractive index for a wide variety of materials.By means of the technique,the transmittance of(Na_0.5Bi_0.5)TiO_3 thin films was measured through a finite aperture in the far field as the sample was moved along the propagation path(Z) of a focused Gaussian beam.The nonlinear lefraction index n_2 of the sample was achieved. |
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| Keywords: | Z-scan technique nonlinear refractive index (Na_0 5Bi_0 5)TiO_3 thin films |
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