Sol-Gel法制备PI/SiO2纳米复合薄膜及结构与性能

采用溶胶凝胶法（Sol-Gel）制备了二氧化硅不同质量分数的聚酰亚胺/二氧化硅（PI/SiO₂）纳米复合薄膜。并用TEM、力学性能、吸水性能及介电性能测试等方法研究了薄膜的结构与性能。结果表明，SiO₂微粒均匀分散在PI基体中，粒径随着SiO₂含量的增加而增大；当SiO₂质量分数在20%以内时对PI基体有增强作用，且在10%左右拉伸强度达到最大，而吸水率逐渐减小，介电常数则变化不大。

Preparation of PI/SiO2 nanocomposite films by Sol-Gel process and its structure and properties

A series of polyimide/silica(PI/SiO_ 2) nanocomposite films with different silica contents were successfully prepared by Sol Gel reaction. TEM,mechanical analysis,water absorption and dielectrics property analysis were employed to characterize the structure and properties of PI/SiO_2 films. The results indicate that the SiO_2 particles homogeneously disperse in the PI matrix and the size of particles increase with the increase in the contents of SiO_2. If the content of SiO_2 is no more than 20% in the matrix of PI, the tensile strength of the film can be improved and reaches a maximum at 10%, the water absorption reduces and the dielectric constants changes a little with the increase in the contents of SiO_2.