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非齐次泊松过程类软件可靠性增长模型
引用本文:刘宏伟,杨孝宗,曲峰,赵金华.非齐次泊松过程类软件可靠性增长模型[J].同济大学学报(自然科学版),2004,32(8):1071-1074.
作者姓名:刘宏伟  杨孝宗  曲峰  赵金华
作者单位:哈尔滨工业大学,计算机科学与技术学院,黑龙江,哈尔滨,150001
基金项目:总装备部“十五”预研基金资助项目 (4 13 16.1.2 )
摘    要:现有的基于故障覆盖率的软件可靠性增长模型多是只考虑了累计故障覆盖率 ,没有描述每个测试用例能够获得的故障覆盖率 .为了使软件可靠性增长模型能更好地刻画软件的测试过程 ,建立了两个基于故障覆盖率的非齐次泊松过程类软件可靠性增长模型 .第一个模型假设每个测试用例有相同的故障检测能力 ,能获得相同的故障覆盖率 ;第二个模型考虑了越晚检测到的故障其被检测到的概率越低的特点 ,模型假设每个测试用例的故障检测能力与其出现的次序相关 .利用一组公开发表的软件失效数据对这两个模型进行了验证 ,结果表明这两个模型在这组失效数据上均能得到较好的拟合效果 .

关 键 词:软件可靠性  增长模型  故障覆盖率  非齐次泊松过程  软件可靠性建模
文章编号:0253-374X(2004)08-1071-04

Software Reliability Growth Models of Non-homogeneous Poisson Process
LIU Hong-wei,YANG Xiao-zong,QU Feng,ZHAO Jin-hua.Software Reliability Growth Models of Non-homogeneous Poisson Process[J].Journal of Tongji University(Natural Science),2004,32(8):1071-1074.
Authors:LIU Hong-wei  YANG Xiao-zong  QU Feng  ZHAO Jin-hua
Abstract:Many software reliability growth models (SRGM) based on fault coverage only consider accumulative fault coverage ignoring that gained by every test case.In order to describe the software testing process in detail,two non-homogeneous Poisson process (NHPP) SRGM incorporating fault coverage are proposed.The first model supposes every test case has equal fault detective ability and can get the same fault coverage.The second model is proposed considering that faults remaining in software have different detected rate and that faults with highest rates are removed first.Fault detectability of a test case is related to the order that it is executed.The goodness-of-fit of the proposed model is examined using a software failure data set.Comparing with some other existing NHPP SRGM,the new models can provide better goodness-of-fits.
Keywords:software reliability  growth model  fault coverage  non-homogeneous Poisson process  software reliability modeling
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