首页 | 本学科首页   官方微博 | 高级检索  
     检索      

减小信道编码安全间隙的两次加扰方案
引用本文:雷维嘉,李玉玉.减小信道编码安全间隙的两次加扰方案[J].系统工程与电子技术,2020,42(2):458-465.
作者姓名:雷维嘉  李玉玉
作者单位:重庆邮电大学通信与信息工程学院, 重庆 400065
基金项目:国家自然科学基金(61971080);国家自然科学基金(61471076);重庆市基础与前沿探索项目(cstc2018jcyjAX0432);重庆市教委科学技术研究重点项目(KJZD-K201800603);重庆市教委科学技术研究重点项目(KJZD-M201900602)
摘    要:安全间隙是衡量安全信道编码保密性能的重要参数,目前相关研究主要考虑误比特率(bit error rate, BER)安全间隙,未考虑误字率(word error rate, WER)安全间隙。为同时减小安全信道编码BER和WER安全间隙,提出一种两次加扰方案。在发送端信道编码器前后各设置一个加扰器,相应在接收端信道译码器前后各设置解扰器,同时增大低信噪比区域的接收BER和WER,减小BER和WER安全间隙。对方案的差错概率进行了理论分析,并对信道编码采用BCH码时系统的性能进行了仿真。理论和仿真结果表明,相较于采用相同信道编码和外扰码器的方案,所提方案在减小WER安全间隙的同时也减小了BER安全间隙。

关 键 词:物理层安全  安全间隙  加扰  信道编码  
收稿时间:2019-05-04

Double scrambling scheme for reducing security gap of channel codes
Weijia LEI,Yuyu LI.Double scrambling scheme for reducing security gap of channel codes[J].System Engineering and Electronics,2020,42(2):458-465.
Authors:Weijia LEI  Yuyu LI
Institution:School of Communication and Information Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
Abstract:The security gap is an important secrecy metric of security channel codes. Relevant works focous on the security gap of bit error rate (BER), rather than that of word error rate (WER). A double scrambling scheme is proposed to reduce the security gap of BER and WER simultaneously. Two scramblers are arranged respectively before and after the channel encoder at the transmitter, and two descramblers are arranged respectively before and after the channel decoder at the receiver. Both the BER and WER of the receiver are increased in the lower signal-noise ratio region. Therefore, the security gaps of BER and WER are decreased. The error rate is analyzed, and simulations are performed when BCH code is employed. Theory analysis and simulation results indicate that the proposed scheme is more effective in reducing the security gaps of BER and WER than the single scrambler scheme with the same channel code.
Keywords:physical layer security  security gap  scrambling  channel codes  
点击此处可从《系统工程与电子技术》浏览原始摘要信息
点击此处可从《系统工程与电子技术》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号