| Abstract: | The transmission electron microscope(TEM)is now one of the most powerful tools for structural characterization due to its high spatial resolution,especially with the advent of the spherical aberration corrector.The interaction between electrons and specimens allows tailoring surface structures by electron irradiation.Furthermore,along with the development of special holders and specimen preparation techniques,the structural evolution of surfaces/interfaces can be dynamically monitored under external fields or reaction environments at the nanoscale,which promotes not only the establishment of the relationship between atomic structures and novel properties,but also potential applications in nanodevices.In this report,we review some of our recent results obtained by TEM,including dynamical observation of surface-mediated novel phenomena,controllable fabrication of nanostructures,and some potential applications in nanodevices. |
