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一体化瞬态高温智能存储测试系统设计
引用本文:石正全,李新娥,郝晓剑.一体化瞬态高温智能存储测试系统设计[J].解放军理工大学学报,2014,0(5):434-439.
作者姓名:石正全  李新娥  郝晓剑
作者单位:1.中北大学 电子测试技术国家重点实验室,山西 太原 030051;
2.中北大学 仪器科学与动态测试教育部重点实验室,山西 太原 030051
基金项目:国家自然科学基金资助项目(61473267);山西省青年科技研究基金资助项目(20130201015)
摘    要:为解决当前瞬态高温测试中存在的测试系统对瞬态高温参数信号响应速度慢、动态特性不足、设备布设及装置回收不便等问题,综合运用无线通信技术、数据采集与缓冲技术和存储测试技术,设计了一种通用一体化瞬态高温智能存储测试系统。该系统可用于特殊测试环境下瞬态高温参数的测试,并实时记录存储测试数据和处理结果。设计了基于蓝宝石黑体平面的瞬态高温敏感体、数据处理存储模块和无线模块,并将瞬态高温敏感体、数据处理存储模块和无线模块进行一体化设计。通过ZigBee模块对系统进行参数设置(上、下电、触发电平、测量范围等),使用AVR单片机和FPGA为主控芯片,解决了特殊测试环境下瞬态高温参数的测试采集问题。实际测试结果表明,该瞬态高温智能存储测试系统可准确获得被测温度场瞬态高温参数,具有无线遥控、微功耗、高精度、抗高冲击、抗干扰、微型化、工作稳定和可靠性高等特点,适于恶劣测试环境下瞬态高温参数的测试和记录。

关 键 词:瞬态高温  存储测试  多通道  蓝宝石黑体
收稿时间:2014/4/21 0:00:00

Design of incorporate intelligent test system for transient high temperature
SHI Zhengquan,YOU Wenbin,.Design of incorporate intelligent test system for transient high temperature[J].Journal of PLA University of Science and Technology(Natural Science Edition),2014,0(5):434-439.
Authors:SHI Zhengquan  YOU Wenbin  
Institution:1. National Key Laboratory for Electronic Measurement Technology,North University of China,Taiyuan 030051,China;
2. Key Laboratory of Instrumentation Science & Dynamic Measurement,North University of China,Taiyuan 030051,China
Abstract:Aimed at the problems of the slow response speed of the transient high temperature parameter signal, the inadequacy of the dynamic characteristics of the test system, the inconwenience of the equipment layout of the test system and the recycle of the test device in the current transient high temperature testing,the incorporate intelligent test system for transient high temperature,which is universal and multi-channel,was designed based on the wireless communication technology,the data acquisition and buffer technology and the storage test technology. The system can be used for transient temperature parameter test in special testing environment,and the real-time record storage of the test data and the processing results. The transient high temperature sensitive body was designed based on the sapphire plane blackbody,the data storage and processing modules and the wireless communication modules were also designed.What is more,an integrated design was made. Adopting the ZigBee module to set the parameters(power up and down,trigger level and measuring range)of the several intelligent temperature probing tips,the system solves the problems of transient temperature parameter test in special testing environment,with AVR and FPGA as the main chip. The actual test results proves that the system can accurately obtain the transient high temperature parameters of the measured temperature field with the characteristics of the wireless remote control,micro power consumption,high precision,high impact resistance,anti-inter-ference,miniaturization,working stability and high reliability,which is suitable for testing and recording the transient high temperature parameters of harsh testing environment.
Keywords:transient high temperature  storage testing  multi-channel  sapphire blackbody
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