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黏接结构紧贴型缺陷超声斜入射法检测
引用本文:吴超,李剑,艾春安.黏接结构紧贴型缺陷超声斜入射法检测[J].科学技术与工程,2022,22(4):1359-1366.
作者姓名:吴超  李剑  艾春安
作者单位:火箭军工程大学导弹工程学院
基金项目:国家自然科学基金面上项目(11772352) 国防重点实验室(6142010203192701001)
摘    要:基于超声斜入射法对粘接结构中存在的紧贴型缺陷进行检测研究,在研究过程中,基于单界面模型制作了板厚为5mm的“有机玻璃-胶层-有机玻璃”含紧贴型脱粘缺陷的试样,采用中心频率为5MHz的水浸聚焦探头对试样分别进行垂直法和斜入射法的C扫描检测试验,斜入射法入射角度在10°~40°范围内,分析了不同入射角度对紧贴型缺陷检测以及气泡缺陷的影响。试验结果表明,斜入射法相较于垂直入射法对紧贴型缺陷的检测有明显的优势,且以第一临界角作为入射角度检测时检测效果最佳,但是随着入射角度的增加,斜入射法对于气泡缺陷检测的效果越来越差。

关 键 词:粘接结构  紧贴型缺陷  气泡缺陷  斜入射  C扫描成像
收稿时间:2021/6/7 0:00:00
修稿时间:2021/11/12 0:00:00

Research on the Ultrasonic Oblique Incidence Method for Detecting Adhesive Structure Adhesive Defects
Wu Chao,Li Jian,Ai Chunan.Research on the Ultrasonic Oblique Incidence Method for Detecting Adhesive Structure Adhesive Defects[J].Science Technology and Engineering,2022,22(4):1359-1366.
Authors:Wu Chao  Li Jian  Ai Chunan
Institution:Rocket Force University Of Engineering School of Missile Engineering,Xi''an,710025;Rocket Force University Of Engineering School of Missile Engineering,Xi''an,710025
Abstract:Research on the detection of close-fitting defects in the adhesive structure based on the ultrasonic oblique incidence method,In the research process, a 5mm thick "plexiglass-adhesive layer-plexiglass debonding defects was produced based on the single interface model, and a water immersion focusing probe with a center frequency of 5MHz was used for the test. C-scan detection tests of the vertical method and the oblique incidence method were carried out respectively. The incidence angle of the oblique incidence method was in the range of 10°~40°, and the influence of different incident angles on the detection of close-fitting defects and bubble defects was analyzed. The research results show that the oblique incidence method has obvious advantages in detecting close-fitting defects compared with the vertical incidence method, and the detection effect is best when the first critical angle is used as the incident angle. However, as the incident angle increases, the oblique incident method is less and less effective in detecting bubble defects.
Keywords:Adhesive structure  close-fitting defect  bubble defect  oblique incidence  C-scan imaging
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