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PLZT(7/40/60)薄膜介电驰豫特征的研究
引用本文:张超,余大书.PLZT(7/40/60)薄膜介电驰豫特征的研究[J].天津师范大学学报(自然科学版),2011,31(3):41-44.
作者姓名:张超  余大书
作者单位:天津师范大学 物理与电子信息学院,天津,300387
基金项目:天津市高等学校科学发展基金资助项目,天津师范大学博士基金资助项目,天津师范大学与上海天泰茶业科技有限公司开发项目
摘    要:利用溶胶-凝胶技术制备PLZT薄膜,对样品进行X射线衍射和高频介电谱测试,结果表明:薄膜为钙钛矿结构,呈现110]择优取向,100 MHz介电温谱显示该薄膜具有弛豫铁电体特征,介电频谱表明PLZT薄膜具有介电弛豫特征,体现温度弥散特性,通过理论拟合Cole-Cole曲线得到弛豫时间的分布函数,结合弛豫铁电体特性,时介...

关 键 词:PLZT薄膜  溶胶-凝胶法  弛豫铁电体  介电谱  弛豫时间分布

Study on dielectric relaxation characterization of PLZT(7/40/60) films
ZHANG Chao,YU Dashu.Study on dielectric relaxation characterization of PLZT(7/40/60) films[J].Journal of Tianjin Normal University(Natural Science Edition),2011,31(3):41-44.
Authors:ZHANG Chao  YU Dashu
Institution:ZHANG Chao,YU Dashu College of Physics and Electronic Information Science,Tianjin Normal University,Tianjin 300387,China
Abstract:PLZT film prepared by Sol-Gel process was tested for XRD and dielectric spectrum including the dielectric spectrums for temperature and frequency in high frequency.The results showed that the film was perovskite structure and preferred orientation.There is the character of relaxation ferroelectric in the sample,and the sample is relaxation ferroelectric.Based on the dielectric frequency spectrums,the sample has dielectric relaxation feature,and also shows temperature diffusion.The distribution of relaxation...
Keywords:PLZT films  Sol-Gel  relaxation ferroelectric  dielectric spectrum  distribution of relaxation time  
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