| 原子力显微镜和扫描隧道显微镜兼容系统的研制 |
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| 引用本文： | 李创社,宋建平,李实,唐天同.原子力显微镜和扫描隧道显微镜兼容系统的研制[J].西安交通大学学报,1999,33(5):10-12,37. |
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| 作者姓名： | 李创社 宋建平 李实 唐天同 |
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| 作者单位： | 西安交通大学,710049,西安 |
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| 摘 要： | 扫描隧道显微镜（ＳＴＭ）和原子力显微镜（ＡＦＭ）由于具有原子量级的分辨率，所以在表面物理，化学，生物学领域得到了越来越广泛的应用。但是，扫描隧道显微镜只能观察导电样品，这就限制了它的应用范围。
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| 关 键 词： | 原子力显微镜 扫描隧道显微镜 微悬臂 兼容系统 |
A Compatible Atomic Force and ScanningTunneling Microscope System |
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| Li Chuangshe,Song Jianping,Li Shi,Tang Tiantong.A Compatible Atomic Force and ScanningTunneling Microscope System[J].Journal of Xi'an Jiaotong University,1999,33(5):10-12,37. |
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| Authors: | Li Chuangshe Song Jianping Li Shi Tang Tiantong |
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| Abstract: | Scanning tunneling microscope(STM) and atomic force microscope (AFM) have been widely used in the fields of surface physics, chemistry, biology etc., because they both yield resolution at the atomic scale level. The former requires the samples to be conductive while the latter applies to both conductive and nonconductive samples. The proposed system could replace with STM and AFM with nano scale resolution while further refinement can be made to include the atomic level. |
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| Keywords: | AFM STM cantilever tunnel current |
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