基于符号方法的模拟电路可测度分析

现有电路可测度符号分析方法在低可测度电路故障诊断中没有考虑元件故障模糊组的影响。可测度分析时需要计算所有元件参数组合的可测度，但实质上其中部分参数组合的可测度是相同的，不必重复计算。鉴于上述问题，在可测度符号分析方法的基础上，提出根据系数依赖矩阵划分元件故障模糊组，将各个模糊组中的元件参数赋值后计算电路可测度。该方法减少了符号法可测度分析的计算量，适用于模拟电路的自动测试与故障诊断。

Analysis of Analog Circuit Testability Based on Symbolic Method

The current symbolic testability analysis method doesn＇t consider the influence of ambiguous groups in the failure diagnostic of low testability circuit. The testability of all components parameters combinations is computed in the analysis of testability,but in fact the testability of some parameter combinations is equal and no need to compute repeatedly. For this reason,on the basis of symbolic method of testability a coefficient dependence matrix was proposed to divide fault ambiguous groups of components, and then, the testability was computed after assigning the components in every ambiguous group. The proposed method reduces testability computation load and is suited to test the analog circuit automatically and diagnose the faults.