| 磁粉探伤自动识别系统的研制 |
| |
| 引用本文： | 刘震宇,于轮元.磁粉探伤自动识别系统的研制[J].西安交通大学学报,1988(3). |
| |
| 作者姓名： | 刘震宇 于轮元 |
| |
| 作者单位： | 西安交通大学电气工程系，西安交通大学电气工程系 |
| |
| 摘 要： | 本文提出的荧光磁粉探伤自动识别系统,消除了紫外激发光源中可见光的干扰,较好地克服了放大系统的温漂,抑制了高增益放大器中的电磁干扰。这些技术关键的解决,为实现试件缺陷的全自动辨识提供了依据和途径.
|
| 关 键 词： | 磁粉检验 无损检验 |
A NEW AUTOMATIC SYSTEM OF DISTINGUISHING CRACKS IN MAGNETIC PARTICLE INSPECTION |
| |
| Liu Zhenyu,Yu Lunyuan.A NEW AUTOMATIC SYSTEM OF DISTINGUISHING CRACKS IN MAGNETIC PARTICLE INSPECTION[J].Journal of Xi'an Jiaotong University,1988(3). |
| |
| Authors: | Liu Zhenyu Yu Lunyuan |
| |
| Institution: | Liu Zhenyu;Yu Lunyuan Department of Electrical Engineering |
| |
| Abstract: | The new automatic system of distinguishing defects on test workpiece surface presented in this paper has wiped out all the influence of visible light given by ultraviolet exciting lamp,overcome the zero drift of the amplifier, and restrained the electromagnetic interference in the high gain amplifier. It is solving these key problems that makes a new way for automatically dis- tinguishing defects on test workpiece surface with magnetic particle inspection. |
| |
| Keywords: | magnetie particle tests non-destructive tests |
| 本文献已被 CNKI 等数据库收录！ |
