| s-水平因析设计的广义分辨度和最小低阶混杂准则 |
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| 引用本文： | 艾明要 张润楚. s-水平因析设计的广义分辨度和最小低阶混杂准则[J]. 南开大学学报(自然科学版), 2004, 37(1): 58-63 |
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| 作者姓名： | 艾明要 张润楚 |
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| 作者单位： | 南开大学数学科学学院,天津,300071;南开大学数学科学学院,天津,300071 |
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| 基金项目： | Supported by NSSF( 1 0 1 71 0 5 1 ) |
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| 摘 要： | 对于二水平因析设计,献[2,3]提出了广义分辨度和最小低阶混杂准则对不同的(正规的或非正规的)设计排序．本将他们的结果推广到任意的s-水平因析设计得到了一般的形式,其中s是任意素数或素数幂．
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| 关 键 词： | 部分因析设计 组合和代数正交 字长型 混杂 J-特征值 |
GENERALIZED RESOLUTION AND MINIMUM ABERRATION CRITERIA FOR S-LEVEL FACTORIAL DESIGNS |
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| Abstract. GENERALIZED RESOLUTION AND MINIMUM ABERRATION CRITERIA FOR S-LEVEL FACTORIAL DESIGNS[J]. Acta Scientiarum Naturalium University Nankaiensis, 2004, 37(1): 58-63 |
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| Authors: | Abstract |
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| Abstract: | For two level fractional factorial designs, refernces[2,3] proposed a generalized resolution and minimum aberration criterion for ranking the different designs, regular or nonregular. This paper generalizes their results for s level factorial designs, where s is any prime or prime power, and gets a general conclusion. |
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| Keywords: | fractional factorial design combinatorial and algebraic orthogonality word length pattern confounding J characteristics |
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