| 随机存储器的故障诊断 |
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| 引用本文： | 王辉军,刘长欢.随机存储器的故障诊断[J].北京化工大学学报(自然科学版),1992(4). |
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| 作者姓名： | 王辉军 刘长欢 |
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| 作者单位： | 北京化工学院
(王辉军)，东北师范大学(刘长欢) |
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| 摘 要： | 用随机测试的方法进行RAM的故障诊断,给出了故障定位的算法,利用该算法能方便地对可能发生在RAM存储器中的故障进行诊断与定位。
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| 关 键 词： | 随机存储器 故障诊断 随机测试 |
RAM's Faults Diagnosis |
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| Wan Huijun,Liu Changhuan Beijing Institute of Chemical Technology Northeast Normal University.RAM''''s Faults Diagnosis[J].Journal of Beijing University of Chemical Technology,1992(4). |
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| Authors: | Wan Huijun Liu Changhuan Beijing Institute of Chemical Technology Northeast Normal University |
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| Institution: | Wan Huijun;Liu Changhuan Beijing Institute of Chemical Technology Northeast Normal University |
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| Abstract: | In this paper, random testing method (RT) is used to diagnose faults ofRAM. An algorithm is given for conveniently testing, diagnosing and locating variousfaults of RAM. |
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| Keywords: | RAM fqult diagnosis random testing |
| 本文献已被 CNKI 等数据库收录！ |
