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电大腔中非线性器件响应统计规律的实验研究
引用本文:李彬,赵远,曹张帅,赵翔,闫丽萍.电大腔中非线性器件响应统计规律的实验研究[J].四川大学学报(自然科学版),2015,52(6):1262-1266.
作者姓名:李彬  赵远  曹张帅  赵翔  闫丽萍
作者单位:四川大学电子信息学院;四川大学电子信息学院;四川大学电子信息学院;四川大学电子信息学院;四川大学电子信息学院
基金项目:国家自然科学基金委员会和中国工程物理研究院联合基金(NSAF 11176017); 国家重点基础研究发展计划项目(2013CB328904)
摘    要:通过实验研究了带有模式搅拌器电大腔体模拟的混响室测量环境中电场模值以及腔内通过场线耦合激发的线性器件和非线性器件功率响应的统计规律,获得了不同输入功率时,空腔内电场总场模值,线性/非线性器件归一化功率响应的概率密度函数.结果显示不同输入功率对应的空腔电场模值和线性器件的归一化功率值各自满足的统计规律基本相同.而非线性器件输出功率中谐波功率的统计规律随输入功率的变化而有所不同.这些统计规律对于复杂电磁环境下电子系统的电磁效应分析具有重要意义.

关 键 词:电大腔    模式搅拌    统计规律    非线性器件
收稿时间:3/3/2015 12:00:00 AM

Experimental study on the statistical response of non linear device in an electrically large cavity
LI Bin,ZHAO Yuan,CAO Zhang Shuai,ZHAO Xiang and YAN Li Ping.Experimental study on the statistical response of non linear device in an electrically large cavity[J].Journal of Sichuan University (Natural Science Edition),2015,52(6):1262-1266.
Authors:LI Bin  ZHAO Yuan  CAO Zhang Shuai  ZHAO Xiang and YAN Li Ping
Institution:College of Electronics and Information Engineering, Sichuan University;College of Electronics and Information Engineering, Sichuan University;College of Electronics and Information Engineering, Sichuan University;College of Electronics and Information Engineering, Sichuan University;College of Electronics and Information Engineering, Sichuan University
Abstract:This paper investigates the statistical distribution of electric field and statistical response of a linear and non linear device caused by field to transmission line coupling in an electrically large cavity with a mode stirrer. The probability density function (PDF) of mean normalized electric field and of mean normalized power output from linear and nonlinear devices is obtained. It is observed that the shape of PDF plots of mean normalized electric field and of mean normalized power output from linear device keeps almost the same in terms of different input power, while the PDF of mean normalized harmonic power output from the non linear device varies. These statistical results may be helpful for the analysis of electromagnetic environment effects of the electronic system.
Keywords:Electrically large cavity  Mode stirring  Statistical response  Non linear device
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