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Discussion on the relationship between ΔVEB and IE presented in thermal resistance standard IEC60747-7 Version 2000
Authors:MIAO Qinghai  Miao Yuan  Zhu Yangjun  Zhang Xinghua  YANG Lieyong  YANG Zhiwei  Zhang Dejun  CHEN Fengxia  LU Shuojin
Abstract:
This paper points out an error in the principle figure and the waveform figure of the thermal resistance standard IEC747-7, which describes the relation between the I-V curves and the temperature. It theoretically proves that the I-V-T curve of the standard contradicts the physical law. This contradiction is also revealed by experimental results. Finally, the correct I-V-T characteristic curve and the waveform figure at two different temperatures for the same transistor is given, which serves as the reference to correct the standard.
Keywords:transistor  thermal resistance  standard
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