| 用X射线线形精炼法分析纳米晶体的微观结构 |
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| 引用本文： | 高忠民,王文字,徐跃,李向山. 用X射线线形精炼法分析纳米晶体的微观结构[J]. 吉林大学学报(理学版), 2001, 0(1): 78-80 |
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| 作者姓名： | 高忠民 王文字 徐跃 李向山 |
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| 作者单位： | 1. 吉林大学分析测试中心,
2. 吉林大学材料科学系, |
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| 摘 要： | 利用广角 X射线衍射仪 ,采用单线傅氏线形精炼分析法 ,研究不同制备方法及不同处理条件的纳米晶体的晶粒大小和微观畸变
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| 关 键 词： | 纳米晶 X射线线形精炼法 晶粒大小 微观畸变 |
| 文章编号： | 0529-0279(2001)01-0078-03 |
| 修稿时间： | 2000-08-24 |
The Microstructure of Nanocrystal by X ray Diffraction Line Profile Refine Analysis |
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| GAO Zhong-min,WANG Wen-Yu,XU Yao,LI Xiang-shan. The Microstructure of Nanocrystal by X ray Diffraction Line Profile Refine Analysis[J]. Journal of Jilin University: Sci Ed, 2001, 0(1): 78-80 |
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| Authors: | GAO Zhong-min WANG Wen-Yu XU Yao LI Xiang-shan |
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| Abstract: | The grain size and microdistortion of some nanomaterials synthesized by different methods, from different materials and treated under different disposal conditions were studied by means of wide angel X ray diffraction (WAXD) and single line fourier line shape refine analysis. |
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| Keywords: | nanocrystal X ray line profile refine method grain size distortion. |
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