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| 变形的全场衍射测量 | |
| 引用本文： | 许勇,齐龙. 变形的全场衍射测量[J]. 实验室科学, 2009, 0(1): 123-125 |
| 作者姓名： | 许勇 齐龙 |
| 作者单位： | 天津大学,精密仪器与光电子工程学院,天津,300072 |
| 摘 要： | 提出了测量全场应力应变的一种新方法，它可用于测量被测物体整个表面的变形量，这种方法为非接触测量，不影响被测量物的表面。 |
| 关 键 词： | 激光衍射 全场衍射 CCD 柱面镜 |
Deformation of the whole diffraction measurements |
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| XU Yong,QI Long. Deformation of the whole diffraction measurements[J]. Laboratory Science, 2009, 0(1): 123-125 | |
| Authors: | XU Yong QI Long |
| Affiliation: | (College of Precision Instrument and Opto- electronics Engineering, Tianjin University, Tianjin 300072, China) |
| Abstract: | This paper presents the whole stress - strain measurements of a new method. It can be used to measure the entire surface of measured object deformation. This method of non - contact measurement does not affect the surface being measured. |
| Keywords: | CCD |
| 本文献已被 维普 万方数据 等数据库收录！ | |