| 一种新的基于输入相容的低功耗内建自测试架构 |
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| 引用本文： | 邱航. 一种新的基于输入相容的低功耗内建自测试架构[J]. 淮阴师范学院学报(自然科学版), 2008, 7(4) |
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| 作者姓名： | 邱航 |
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| 作者单位： | 南京工程学院,工程基础实验与训练中心,江苏,南京,211167 |
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| 摘 要： | 为了降低测试成本,提出了一种降低平均异动次数的低功耗内建自测试架构,以降低单位时间异动的次数.同时应用输入相容的原理来减小测试长度,结果表明所用方法是有效的.
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| 关 键 词： | 内建自测试 功率消耗 低功耗测试 输入相容 |
A New Low Power BIST Structure Based on Input Compatibility |
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| QIU Hang. A New Low Power BIST Structure Based on Input Compatibility[J]. Journal of Huaiyin Teachers College(Natrual Science Edition), 2008, 7(4) |
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| Authors: | QIU Hang |
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| Abstract: | This paper proposes a new low power BIST(Built-In Self Test) structure that can reduce average switching activity to reduce the test cos.Based on this structure the test length can be reduced by using theory of input compatibility.The result proves that the porposed method effective. |
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| Keywords: | BIST(Built-In Self Test) power consumption low power test input compatibility |
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