首页 | 本学科首页   官方微博 | 高级检索  
     检索      

切缝宽度对药包爆炸效应影响的动光弹试验
引用本文:肖正学,陆忞,陆渝生,张志呈,邱艳宇.切缝宽度对药包爆炸效应影响的动光弹试验[J].解放军理工大学学报,2006,7(4):371-375.
作者姓名:肖正学  陆忞  陆渝生  张志呈  邱艳宇
作者单位:[1]西南科技大学,四川绵阳621010 [2]东南大学,江苏南京210096 [3]解放军理工大学工程兵工程学院,江苏南京210007
基金项目:四川省绵阳市科技局资助项目
摘    要:为了解切缝宽度对切缝药包爆炸聚能效应的影响,用动态光弹性法对不同切缝宽度的切缝药包的爆炸过程进行了试验,获得了切缝药包爆炸过程中的序列等差条纹图。通过对条纹图和动态应力集中系数的分析比较,得到了爆炸初期沿切缝方向的最大剪应力的回归曲线和公式,明确了切缝宽度对切缝药包爆炸效应影响的规律,即切缝宽度越小,聚能效应越明显,破坏威力也越大。

关 键 词:切缝药包  切缝宽度  爆炸效应  动态光弹性法
文章编号:1009-3443(2006)04-0371-05
收稿时间:2006-04-06
修稿时间:2006年4月6日

Dynamic photoelasticity experimental study on influence of slit's width on slit charge's blast effect
XIAO Zheng-xue,LU Min,LU Yu-sheng,ZHANG Zhi-cheng and QIU Yan-yu.Dynamic photoelasticity experimental study on influence of slit''s width on slit charge''s blast effect[J].Journal of PLA University of Science and Technology(Natural Science Edition),2006,7(4):371-375.
Authors:XIAO Zheng-xue  LU Min  LU Yu-sheng  ZHANG Zhi-cheng and QIU Yan-yu
Institution:Southwest University of Science and Technology,Mianyang 621010,China;Southeast University,Nanjing 210096,China;Engineering Institute of Corps of Engineers,PLA Univ.of Sci.& Tech.,Nanjing 210007,China;Southwest University of Science and Technology,Mianyang 621010,China;Engineering Institute of Corps of Engineers,PLA Univ.of Sci.& Tech.,Nanjing 210007,China
Abstract:The experimental study on the cumulative effectiveness of different slit charge based on dynamic photoelasticity method was made,and the isochromatic fringes graphs in the process of blasting of the slit charge were obtained.By analyzing these graphs and the concentration coefficient of dynamic stress,the width effect on cumulative effectiveness was investigated,and the regression curve and formula of maximum shear stress were obtained.Consequently,the rules of the influence of slit's width on slit charge's blast effect were revealed.
Keywords:slit charge  width of slit  blast effect  dynamic photoelasticity
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《解放军理工大学学报》浏览原始摘要信息
点击此处可从《解放军理工大学学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号