| 用投影光栅测量三维物体表面形状 |
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| 引用本文： | 周建勤,梁竹健.用投影光栅测量三维物体表面形状[J].北京师范大学学报(自然科学版),1995,31(2):207-211. |
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| 作者姓名： | 周建勤 梁竹健 |
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| 作者单位： | 北京师范大学物理学系 |
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| 摘 要： | 详细分析了投影光栅的频谱结构、位相信号的频率范围及背景亮度等因素对测量精度的影响，提出了光栅周期、滤波器通频带及光栅信号幅度的选择范围。
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| 关 键 词： | 投影光栅 调制 频谱 滤波 三维信息 表面形状 |
TO MEASURE SURFACE OF A 3-D OBJECT BY PROJECT GRATING |
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| Zhou Jianqin, Liang Zhujian.TO MEASURE SURFACE OF A 3-D OBJECT BY PROJECT GRATING[J].Journal of Beijing Normal University(Natural Science),1995,31(2):207-211. |
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| Authors: | Zhou Jianqin Liang Zhujian |
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| Abstract: | It is a significant and practical detection technique to untouchedly measure thesurface of 3-D object by using project grating. Several factors, coming from the frequency spectrum of the grating,the frequency range of the phase signal and the background luminance,which may exert an influence on the measurement accuracy, are analyzed in detail.The periodof the grating,the range of band filter and the amplitude of grating signal are also discussed . |
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| Keywords: | project grating modulation frequency spectrum filtering |
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