首页 | 本学科首页   官方微博 | 高级检索  
     检索      

阳离子SiX+(X=F,Cl,S,P,Br)分子光谱和分子特性的理论研究
引用本文:陈恒杰,程新路,苏欣纺,李清焕.阳离子SiX+(X=F,Cl,S,P,Br)分子光谱和分子特性的理论研究[J].四川大学学报(自然科学版),2007,44(2):356-360.
作者姓名:陈恒杰  程新路  苏欣纺  李清焕
作者单位:四川大学原子与分子物理研究所,成都,610065
基金项目:国家自然科学基金;中国工程物理研究院基金
摘    要:应用密度泛函B3LYP方法合并Dunning等人的相关一致自恰基组d-aug-cc-pVxZ(x=D,T,Q,5,6),研究了阳离子SiX+(X=F,Cl,S,P,Br) 的基态光谱常数和分子特性.首先对所研究分子进行单点能扫描,并将结果拟合到SPF展式,然后从SPF展式抽取光谱常数.结果表明,随着基组的不断增大,各种光谱常数很好的自洽收敛.最后,我们将结果外推到CBS极限,理论计算结果和已报到的实验结果以及其它理论值都非常吻合.其中SiS+,SiP+,SiBr+分子的部分光谱常数的理论值为首次报道.

关 键 词:阳离子  光谱常数  分子特性
文章编号:0490-6756(2007)02-0356-05
收稿时间:9/8/2006 12:00:00 AM
修稿时间:2006-09-08

Theoretical study of spectroscopic constants and molecular properties of SiX+ (X= F,S,P,Cl,Br) cation
CHEN Heng-jie,CHENG Xin-lu,SU Xing-fang and LI Qing-huan.Theoretical study of spectroscopic constants and molecular properties of SiX+ (X= F,S,P,Cl,Br) cation[J].Journal of Sichuan University (Natural Science Edition),2007,44(2):356-360.
Authors:CHEN Heng-jie  CHENG Xin-lu  SU Xing-fang and LI Qing-huan
Institution:Institute of Atomic and Molecular Physics, Sichuan University,Institute of Atomic and Molecular Physics, Sichuan University,Institute of Atomic and Molecular Physics, Sichuan University,Institute of Atomic and Molecular Physics, Sichuan University
Abstract:Structure,spectroscopic constants and molecular properties of several cations SiX+(X=F,Cl,S,P,Br) in their ground states have been studied in detail using HF/DF B3LYP method together with a series of doubly augmented correction consistent basis sets d-aug-cc-pVxZ (x=D,T,Q,5,6).The values of complete basis set(CBS) limit have also been extracted.The consistency of the calculated values of spectroscopic constants and molecular properties of these ions agree well with the experimental and theoretical values wherever available.Part of spectroscopic constants of SiS+,SiP+ and SiBr+ are reported first.
Keywords:B3LYP
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《四川大学学报(自然科学版)》浏览原始摘要信息
点击此处可从《四川大学学报(自然科学版)》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号