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基于BIST的板级数模混合电路的可测性研究
引用本文:王昶辉,朱敏,杨春玲.基于BIST的板级数模混合电路的可测性研究[J].世界科技研究与发展,2009,31(5):861-863.
作者姓名:王昶辉  朱敏  杨春玲
作者单位:哈尔滨工业大学电气工程及自动化学院,哈尔滨,150001
摘    要:本文通过对电路板可测性设计技术的广泛研究,提出基于板级BIST技术的可测性设计方法,在此基础上设计和研制了具有可测性的板级数模混合电路验证样机。该样机采用分块监测,逐级诊断的故障诊断策略,采用模块和元件两级故障定位方法,验证平台的测试实验表明分级监测的可行性,指明了可测性设计和内建自测试技术的研究新思路。

关 键 词:可测性设计  数模混合电路  故障诊断  内建自测试

A Testability Research of Board-level Mixed Circuit Based on BIST
WANG Changhui,ZHU Min,YANG Chunling.A Testability Research of Board-level Mixed Circuit Based on BIST[J].World Sci-tech R & D,2009,31(5):861-863.
Authors:WANG Changhui  ZHU Min  YANG Chunling
Institution:(Department of Electrical Engineering, Harbin Institute of Technology, Harbin 150001 )
Abstract:Through widely research on testability circuit design, this paper proposes the board-level BIST design method for testability product. On the basis of testability design theory,a board-level mixed circuit platform has been developed,which built on classification detection and sequential fault diagnosis strategies. This system is divided into functional modules and circuit fault diagnosis to locate the faults in module and component level. Finally, through the analysis of test results of platform, it points out a good direction of testability design and BIST technology research.
Keywords:testability design  mixed circuit  fault diagnosis  BIST
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