| 基于随机访问扫描的低功耗确定性测试方案 |
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| 引用本文： | 陈田,梁华国,易茂祥,王伟,黄正峰,张敏生.基于随机访问扫描的低功耗确定性测试方案[J].中国科学技术大学学报,2011,41(8). |
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| 作者姓名： | 陈田 梁华国 易茂祥 王伟 黄正峰 张敏生 |
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| 作者单位： | 1. 合肥工业大学计算机与信息学院,安徽合肥,230009
2. 合肥工业大学电子科学与应用物理学院,安徽合肥,230009 |
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| 基金项目： | 国家自然科学基金(60876028),国家自然科学基金重点项目(60633060); 教育部博士点基金(200803590006),教育部博士学科点专项基金(200803591033)资助; 安徽省教育厅自然科学重点项目(KJ2010A280) |
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| 摘 要： | 大规模高密度的集成电路在测试中面临着测试数据量大、测试时间长和测试功耗高的问题.为此提出了一种基于随机访问扫描(random access scan,RAS)的混合模式测试体系结构,该测试方法先通过自动测试模式生成一个确定测试集,再将确定测试集嵌入片上生成的测试序列中进行确定性测试.测试分两个阶段进行,第一阶段利用块固定折叠计数器生成的具有块固定特征的测试模式序列,测试电路中的大部分故障；第二阶段,通过位跳变方法生成确定测试模式,测试剩余的难测故障.在ISCAS-89基准电路上的实验结果表明,该方案不仅减少了测试存储量和测试时间,而且有效地降低了测试功耗.
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| 关 键 词： | BFF计数器 随机访问扫描 确定性测试 低功耗 |
A low power deterministic test scheme based on random access scan structure |
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| CHEN Tian,LIANG Huaguo,YI Maoxiang,WANG Wei,HUANG Zhengfeng,ZHANG Minsheng.A low power deterministic test scheme based on random access scan structure[J].Journal of University of Science and Technology of China,2011,41(8). |
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| Authors: | CHEN Tian LIANG Huaguo YI Maoxiang WANG Wei HUANG Zhengfeng ZHANG Minsheng |
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| Institution: | CHEN Tian1,LIANG Huaguo2,YI Maoxiang2,WANG Wei1,HUANG Zhengfeng2,ZHANG Minsheng1(1.School of Computer and Information,Hefei University of Technology,Hefei 230009,China,2.School of Electronic Science and Applied Physics,China) |
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| Abstract: | High density and large scale IC faces many problems during tests,such as huge amounts of test data,long test application time and high test power dissipation.A test scheme based on random access scan architecture for mixed-mode test was proposed.A pre-computed set of deterministic test cubes were embedded in test sequences generated on chip.The test process consists of two steps.The first step relied on a new type of test pattern generator called block-fixing folding(BFF) counter.The deterministic test cube... |
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| Keywords: | block-fixing folding counter random access scan deterministic test low power consumption |
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