测量晶体相位延迟量的λ/4波片法研究

在对晶体材料的光学性质的研究和对晶体器件延迟量的测量中，常因光源起伏影响测量精度，出现较大的测量误差．如果避开光源强度的起伏，将会使测量系统大大简化，同时使测量精度得以提高，减少测量误差．文章利用偏振光偏振态的变化，搭建一套测量系统．利用角度测量替代光强的直接测量，可比较精确地测量晶体的延迟量．由于该测量系统不需直接测量光强，避免了光强不稳定对测量结果的影响．与传统测量方法相比，该测量系统具有构造简单，不受光源起伏影响，以及测量精度高等特点．

Phase Retardation Measurement with λ/4 Wave Plate

In the research of light quantity to the crystal material and in the survey to the crystal retards component, the measuring accuracy is influenced heavily because of the photo source fluctuation. If the fluctuation of the light intensity is avoided, it will be able to cause the measurement system become big simplification, and enhance the measuring accuracy, reduces the measuring error. In this paper, using polarization condition change of polarized light, a set of measurement systems is built. It uses measurement of angle substitute luminous intensity direct survey; the comparable precise beat resonance piece detention quantity carries on the survey. Because this measurement system does not need the direct survey luminous intensity, if avoid the influence of the luminous intensity not stabilizing to the measurement result. Compares with the tradition measuring technique, this measurement system has the virtue of simple, no photo source fluctuation influence, as well as highmeasuring accuracy.