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Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation
作者单位:Key Laboratory of Embedded Systems and Service Computing Ministry of Education of Shanghai,Department of Computer Science and Technology,Tongji University,201804.,Shanghai 201804,China
基金项目:国家重点基础研究发展计划(973计划);国家自然科学基金
摘    要:The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.


Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation
WANG Zhen,JIANG Jianhui,YANG Guang. Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation[J]. Tsinghua Science and Technology, 2007, 12(Z1): 32-38
Authors:WANG Zhen  JIANG Jianhui  YANG Guang
Abstract:The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.
Keywords:soft error  soft error rate  signal reliability  failure probability  reliability estimation
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