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万能转换开关触点组合逻辑检测仪的研制
引用本文:杨宝振.万能转换开关触点组合逻辑检测仪的研制[J].上海理工大学学报,2000,22(1):80-84.
作者姓名:杨宝振
作者单位:上海理工大学光学与电子信息工程学院!上海200093
摘    要:介绍了万能转换开关触点组合逻辑检测仪的设计原理及其机械夹具设计,硬件组成,开关参数存储数据结构设计,程序结构,开关型号查找子程序设计等.该检测仪专用于对各种类型万能转换开关触点组合逻辑进行出厂检测.

关 键 词:万能转换开关  夹具  触点组合逻辑  检测仪

The development of testing instrument for contact combination logic of universal change switch
YANG Bao-zhen,DAI Shu-guang.The development of testing instrument for contact combination logic of universal change switch[J].Journal of University of Shanghai For Science and Technology,2000,22(1):80-84.
Authors:YANG Bao-zhen  DAI Shu-guang
Abstract:The design and establishment of testing instrument for contact combination logic of universal change switch are reported. A brief discussion is made on the mechanical chuck, software, hardware and the basic operation principle of the testing instrument. With the testing instrument the contact combination logic for all sorts of universal change switches can be tested. Because of the flexibility of the chuck and data memory structure, the testing instrument can be used for more switch testing types by changing only some set-ups of software.
Keywords:universal change switches  testing  chuck  data memory structure  
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