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基于伪标签-1D DenseNet-KNN的光伏阵列开集复合故障诊断方法
引用本文:陈泽理,卢箫扬,林培杰,赖云锋,程树英,陈志聪,吴丽君.基于伪标签-1D DenseNet-KNN的光伏阵列开集复合故障诊断方法[J].福州大学学报(自然科学版),2023,51(4):490-497.
作者姓名:陈泽理  卢箫扬  林培杰  赖云锋  程树英  陈志聪  吴丽君
作者单位:福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所,福州大学物理与信息工程学院,微纳器件与太阳能电池研究所
基金项目:福建省科技厅引导性基金资助项目(2022H0008);福建省工信厅项目(82318075);福建省自然科学基金面上项目(2021J01580);福州市科技计划项目(2021-P-030)
摘    要:提出了一种基于伪标签-1D DenseNet-KNN的光伏阵列故障诊断方法,实现在少标签样本下的光伏阵列复合故障开集识别。首先,分析了各种常见单一故障及灰尘覆盖下复合故障的I-V曲线特性。然后,为了克服常规的半监督机器学习算法需手动提取数据特征,采用一种伪标签与1D DenseNet相结合的半监督方法自动提取特征。最后,将对训练数据提取的特征、训练数据预测的标签及测试样本提取的特征输入K最近邻(KNN)算法进行开集复合故障诊断。实验表明,该方法不仅能准确分类各种已知类样本,而且能识别出未知类别故障,并且模型的训练仅需少量标签数据。

关 键 词:光伏阵列    故障诊断    I-V特性曲线    伪标签半监督学习    开集识别    KNN算法
收稿时间:2022/11/17 0:00:00
修稿时间:2023/1/31 0:00:00

Photovoltaic array open set compound fault diagnosis based on pseudo-label-1D DenseNet-KNN
CHEN Zeli,LU Xiaoyang,LIN Peijie,LAI Yunfeng,CHENG Shuying,CHEN Zhicong,WU Lijun.Photovoltaic array open set compound fault diagnosis based on pseudo-label-1D DenseNet-KNN[J].Journal of Fuzhou University(Natural Science Edition),2023,51(4):490-497.
Authors:CHEN Zeli  LU Xiaoyang  LIN Peijie  LAI Yunfeng  CHENG Shuying  CHEN Zhicong  WU Lijun
Abstract:A fault diagnosis method based on pseudo-label-1D DenseNet-KNN with fewer labeled samples is proposed to classify open-set of compound faults for photovoltaic arrays. First, the I-V characteristic curves of various common single faults and dust covered compound faults are analyzed. Since the semi-supervised machine learning algorithms need to manually extract some features from the data, then a semi-supervised method combining pseudo labels with 1D DenseNet is used to automatically extract features. Finally, the features extracted from the training data, the predicted labels of the training data and the features extracted from the test samples are inputted into the K-Nearest Neighbor(KNN) algorithm for open set compound fault diagnosis. Experiments show that this method can not only classify various known class samples accurately, but also identify unknown class faults, and the training of the model only needs a small amount of labeled data.
Keywords:Photovoltaic array  Fault diagnosis  I-V characteristic curve  pseudo label semi-supervised learning  Open set recognition  KNN algorithm
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