并行测试中死锁避免的设计与仿真

设计了一个双通道运算放大器芯片SD358D的并行测试仿真实例。实例中应用USB数据采集卡和HPVEE软件组成的虚拟仪器对两路放大器的三个指标进行并行测试。由于两个测试任务共享仪器资源,容易发生死锁。为了解决并行测试中的死锁问题,首先为并行测试建立Petri网模型,模型中的变迁发射序列与系统任务调度路径一一对应,利用遗传算法搜索模型中无死锁的序列,然后控制系统按照这些无死锁的路径调度测试任务,就可以有效避免死锁的发生。最后通过实验结果,验证了该方法的正确性。

Simulation and Design about Deadlock-free Problem in Parallel Test

A simulation experiment of the parallel test was designed with the dual channels amplifier SD358D.In the experiment,the test instruments are virtual instruments that are composed with USB data acquiring and HP VEE software.They are used to test the three performances of the two amplifiers.Because the two test tasks share with the test resources,the deadlock often happens.In order to solve the problem,at first,a Petri Net model of parallel test was set up to the parallel test,and then the firing sequence was depended on the task scheduling path.In order to find the firing sequences without deadlock,the genetic algorithm was used.At last,the task scheduling of the parallel test was controlled as the sequences to avoid the deadlock.The experiment result verifies the method.