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| 重位点阵特征参数TEM测定新方法 | |
| 引用本文： | 戎咏华 Gao,M.重位点阵特征参数TEM测定新方法[J].上海交通大学学报,1997,31(4):34-39. |
| 作者姓名： | 戎咏华 Gao M |
| 作者单位： | 上海交通大学国家教委高温材料及高温测试开放实验室 |
| 基金项目： | 美国国家自然科学基金,华东分析测试中心基金 |
| 摘 要： | 重位点阵是描述晶界特性的一种重要模型。本文发展了一种测定重位点阵特征参数的ＴＥＭ新方法，其特点是把系统倾转技术和矩阵计算结合起来，这样既避免了菊池极法的局限性，又避免了极图法的不精确性，从而成为一种实用，快速，精确的测定方法。 |
| 关 键 词： | 透射电子显微镜 重位点阵 晶界特性 晶体学 |
New Method on TEM Determination of CSL Parameters |
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| Rong Yonghua Peng Min Hu Gengxian The State Edncation Commission Open Research Lab for High Temperature Materials and Testing,Shanghai Jiaotong University Gao Ming Wei R. P..New Method on TEM Determination of CSL Parameters[J].Journal of Shanghai Jiaotong University,1997,31(4):34-39. | |
| Authors: | Rong Yonghua Peng Min Hu Gengxian The State Edncation Commission Open Research Lab for High Temperature Materials and Testing Shanghai Jiaotong University Gao Ming Wei R P |
| Abstract: | The coincidence site lattice(CSL) is an important model describing the characteristic of grain boundaries. A new method on transmission electron microscope (TEM) determination of CSL parameters is developed. It is a practical, fast and accurate approach, which combines the systemic tilting with rotational matrix as to avoid the limitation of Kikuchi patterns and inaccuracy of stereogram method developed by the other investigators. |
| Keywords: | transmission electron microscope (TEM) coincidence site lattice (CSL) axis/angle pairs rotational matrix |
| 本文献已被 CNKI 维普 等数据库收录！ | |