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综合退化数据与寿命数据的某型电连接器寿命预测方法
引用本文:王浩伟,徐廷学,周伟.综合退化数据与寿命数据的某型电连接器寿命预测方法[J].上海交通大学学报,2014,48(5):702-706.
作者姓名:王浩伟  徐廷学  周伟
作者单位:(海军航空工程学院 a. 兵器科学与技术系, 山东 烟台 264001;b. 青岛校区, 山东 青岛 266000)
基金项目:国家自然科学基金资助项目(61273058)
摘    要:针对基于寿命数据的预测方法效率不高的问题,在进行温、湿度双应力加速退化试验的基础上,研究了通过分析加速退化数据而进行寿命预测的途径.为了充分利用所收集的产品寿命数据来提高预测精度,提出了综合退化数据与寿命数据的寿命预测方法.分别使用Wiener过程、逆高斯分布和广义Eyring模型对产品性能的退化数据、少量寿命数据以及产品反应率进行建模,并建立了综合以上信息的可靠性模型.在此基础上,利用Markov Chain Monte Carlo仿真方法得到模型参数的点估计值,通过Bootstrap自助抽样法获得了模型参数的估计区间.结果表明,所提出的综合退化数据与寿命数据的方法可以提高寿命预测精度.

关 键 词:电连接器    寿命预测    双应力加速退化试验    Wiener过程  
收稿时间:2013-06-13

Lifetime Prediction Method for Missile Electrical Connector Synthesizing Degradation Data and Lifetime Data
WANG Hao-wei;XU Ting-xue;ZHOU Wei.Lifetime Prediction Method for Missile Electrical Connector Synthesizing Degradation Data and Lifetime Data[J].Journal of Shanghai Jiaotong University,2014,48(5):702-706.
Authors:WANG Hao-wei;XU Ting-xue;ZHOU Wei
Institution:(a. Department of Ordnance Science and Technology, Yantai 264001, Shandong, China; b. Qingdao Campus, Naval Aeronautical and Astronautical University, Qingdao 266000, Shandong, China)
Abstract:To improve the prediction accuracy of the lifetime of a certain type of missile connector, a prediction method synthesizing degradation data and lifetime data was proposed. By modeling the degradation data with Wiener process, modeling a small amount of lifetime data with inverse Gaussian distribution, establishing the reaction rate model with the generalized Eyring model, a comprehensive reliability model was established. Furthermore, the point estimates of the model parameters were obtained through the Markov Chain Monte Carlo simulation method, and the interval estimates were obtained through a bootstrap method. By comparing the prediction results, it was concluded that the approach synthesizing degradation data and lifetime data could improve the prediction accuracy. Key words:
Keywords:electrical connector  lifetime prediction  double-stress accelerated degradation test  Wiener process  
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