| 组合电路内部故障及多故障测试 |
| |
| 引用本文： | 欧阳一鸣.组合电路内部故障及多故障测试[J].合肥工业大学学报(自然科学版),1999(1). |
| |
| 作者姓名： | 欧阳一鸣 |
| |
| 作者单位： | 合肥工业大学计算机与信息学院 |
| |
| 摘 要： | 给出了用一阶布尔差分法的扩展来求组合电路内部单故障测试集的方法；同时也讨论了如何用高阶布尔差分法来求组合电路的多故障测试集，进而给出了求组合电路双重故障测试集的４个公式，并结合具体电路阐述求解相应的故障测试集的过程
|
| 关 键 词： | 一阶布尔差分 二阶布尔差分 单故障 多故障 组合电路 测试 |
TEST FOR INTERNAL FAULT AND MULTIPLE FAULT OF COMBINATIONAL CIRCUIT |
| |
| Ouyang Yiming.TEST FOR INTERNAL FAULT AND MULTIPLE FAULT OF COMBINATIONAL CIRCUIT[J].Journal of Hefei University of Technology(Natural Science),1999(1). |
| |
| Authors: | Ouyang Yiming |
| |
| Institution: | Hefei University of Technology |
| |
| Abstract: | This paper presents a method for seeking out the testing set of a single internal fault of combinational circuits with developed first degree Boolean difference and the testing set of multiple faults of combinational circuits with multiple degree Boolean difference.Four formulas are given to seek out a testing set for double faults in combinational circuits.The fault testing set of concrete circuits is analyzed. |
| |
| Keywords: | first degree Boolean difference second degree Boolean difference single fault multiple faults combinational circuit test |
| 本文献已被 CNKI 等数据库收录！ |
