| 基于高速单片机控制的电气设备智能测试系统 |
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| 引用本文： | 刘金海,胡金高.基于高速单片机控制的电气设备智能测试系统[J].福州大学学报(自然科学版),2008,36(Z1):49-52. |
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| 作者姓名： | 刘金海 胡金高 |
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| 作者单位： | 福州大学电气工程与自动化学院,福建,福州,350002 |
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| 摘 要： | 介绍一种基于DS89C450嵌入式高速单片机、带数据掉电保护及实时时钟记录等功能的电气设备智能测试系统,同时针对其在电脑刺绣数控机床上的应用做了一些功能细化.系统采用上下位架构设计理念,通过通信方法有机联接系统,借用流行的单片机技术与VB技术加于实现.实践证明该系统有较高的性价比及较为广阔的应用前景.
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| 关 键 词： | 高速单片机 智能测试 电气设备 电脑刺绣 |
The high-speed MCU based intelligent electrical device testing system |
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| LIU Jin-hai,HU Jin-gao.The high-speed MCU based intelligent electrical device testing system[J].Journal of Fuzhou University(Natural Science Edition),2008,36(Z1):49-52. |
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| Authors: | LIU Jin-hai HU Jin-gao |
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| Institution: | (College of Electrical Engineering and Automation,Fuzhou University,Fuzhou,Fujian 350002,China) |
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| Abstract: | The paper presents an intelligent electrical device testing system which can protect data when power drops down,record realtime clock,based on embeded high-speed MCU named DS89C450.Meanwhile,there are some function splits for application on computerized embroidery CNC machine.With popular technology of MCU and VB,the system is realized according to top-bottom layout architecture and combined organically by communication.With practice,it's proved that the system is high in cost performance and has a good view of wide applications. |
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| Keywords: | high-speed MCU intelligent testing electrical device computerized embroidery |
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