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Scan Strategy in Electron Beam Selective Melting
Authors:LU Wei  LIN Feng  HAN Ji  ong  QI Haibo  YAN Naisheng
Institution:LU Wei,LIN Feng,HAN Ji,ong,QI Haibo,YAN Naisheng Department of Mechanical Engineering,Tsinghua University,Beijing 100084,China
Abstract:In electron beam selective melting process, powder pushed-away phenomena and uneven temperature field are two main obstacles, which are greatly associated with the electron beam scan mode. In this paper, various scan strategies, including iterative scan mode, reverse scan mode, interlaced reverse scan mode, randomized block scan mode, and constant length scan mode, are investigated. The analyses for each scan strategy are presented based on the influence to the temperature field over the formation zone and ...
Keywords:scan strategy  electron beam selective melting  powder pushed-away  
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