| 数电实验常用芯片检测指示仪简析 |
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| 引用本文： | 孙航,李耀,马利业. 数电实验常用芯片检测指示仪简析[J]. 山西科技, 2010, 25(4): 42-43 |
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| 作者姓名： | 孙航 李耀 马利业 |
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| 作者单位： | 太原科技大学,山西,太原,030024 |
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| 基金项目： | 山西省大学生创新性实验项目 |
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| 摘 要： | 数字芯片特别是74系列逻辑芯片在学生实验中更是至关重要,实验中要保证实验的效果,必须要求所用的芯片逻辑功能完整,但如果对所用芯片的各个管脚进行逐一测试,就显得十分繁琐。另外,在数字电路的维护和维修中也经常要对芯片的好坏进行检测。针对上述需要,设计了以89C52单片机为控制核心并针对74系列逻辑芯片将传统检测算法进行优化后的简单可行的芯片检测指示仪。
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| 关 键 词： | 数字电子技术 51单片机 芯片检测 |
Detection Indicator for Common IC of Digital Electronic Experiment |
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| SUN Hang,LI yao,MA Liye. Detection Indicator for Common IC of Digital Electronic Experiment[J]. Shanxi Science and Technology, 2010, 25(4): 42-43 |
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| Authors: | SUN Hang LI yao MA Liye |
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| Affiliation: | SUN Hang,LI yao,MA Liye |
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| Abstract: | The digital chip＇s application is getting more and more widespread,especially 74 series logic chips,in the student experiment is very important,it must request the chip logical function which complete to guarantee the experiment＇s effect,but it appears so tedious to test the pin one by one.On the other hand,it must carry on the examination frequently in digital circuit＇s maintenance and the service to the chip quality,in view of the needs above,we designed this detection indicator with the optimized examination algorithm aims at 74 series logic chips based on 89C52 micro controller. |
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| Keywords: | digit electronic technology 51 monolithic integrated circuits the chip examintion |
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