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The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network
引用本文:刘建立 左保齐. The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network[J]. 东华大学学报(英文版), 2007, 24(3): 313-316,325
作者姓名:刘建立 左保齐
作者单位:College of Material Engineering, Soochow University, Suzhou, Jiangsu 215021, (3zina
基金项目:Foundation item; Ministry of Commerce of the People's Republic of China (PRC)
摘    要:


关 键 词:计算机技术 识别模式 丝绸 纺织品
文章编号:1672-5220(2007)03-0313-04
修稿时间:2006-03-23

The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network
LIU Jian-li,ZUO Bao-qi. The Recognition of Silk Fabric Defects Based on Biorthogonal Wavelet Analysis and SOM Neural Network[J]. Journal of Donghua University, 2007, 24(3): 313-316,325
Authors:LIU Jian-li  ZUO Bao-qi
Affiliation:College of Material Engineering, Soochow University, Suzhou, Jiangsu 215021, China
Abstract:
A feasible approach fog the recognition of silk fabric defects based on wavelet transform and SOM neural network is proposed in this paper, the indispensable processes of which are defect images denoising and enhancement, image edge detection, feature extraction and defects identification. Both geometrical and textural feature panuneters are extracted from the edge image and the enhanced defect image, and utifize SOM neural network to recognize the common defects which silk fabrics have, including warp- lacking, weft-lacking, double weft, loom bars, oll-stalin. Experimental results show the advantages with high identification correctness and high inspection speed.
Keywords:silk fabrics  defect recognition  waveletanalysis ! neural network
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