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| 镀锡钢板铬酸盐钝化膜的X射线光电子谱分析 | |
| 引用本文： | 齐国超,贡雪南,孙德恩,刘春明.镀锡钢板铬酸盐钝化膜的X射线光电子谱分析[J].东北大学学报(自然科学版),2006,27(8):875-878. |
| 作者姓名： | 齐国超 贡雪南 孙德恩 刘春明 |
| 作者单位： | 1. 东北大学,材料与冶金学院,辽宁,沈阳,110004 2. 宝山钢铁集团公司,冷轧部,上海,201900 3. 南洋理工大学,机械与制造工程学院,新加坡,639798 |
| 摘 要： | 使用X射线光电子能谱(XPS)全元素扫描分析方法对镀锡钢板铬酸盐钝化膜的成分进行了分析研究.结果表明,组成钝化膜的主要元素为Cr,O,Sn和C.通过Ar+溅射对钝化膜进行深度剖析表明,C元素来自于表面的污染而不是膜层本身;Cr和O元素随着Ar+溅射的进行含量逐渐降低,而Sn元素的含量却逐渐增加.溅射约360 s后,Sn元素的含量已达到了80%以上,此时所对应的钝化膜的厚度约为20 nm.通过窄幅扫描对钝化膜的相组成进行了分析,结果表明钝化膜主要由Cr(OH)3,Cr2O3,Sn及其氧化物构成. |
| 关 键 词： | X射线光电子谱 镀锡钢板 钝化膜 全元素扫描 窄幅扫描 |
| 文章编号： | 1005-3026（2006）08-0875-04 |
| 收稿时间： | 2005-09-23 |
| 修稿时间： | 2005年9月23日 |
XPS Analysis of Chromate Passive Film Deposited on Tinplate |
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| QI Guo-chao,GONG Xue-nan,SUN De-en,LIU Chun-ming.XPS Analysis of Chromate Passive Film Deposited on Tinplate[J].Journal of Northeastern University(Natural Science),2006,27(8):875-878. | |
| Authors: | QI Guo-chao GONG Xue-nan SUN De-en LIU Chun-ming |
| Institution: | (1) School of Materials and Metallurgy, Northeastern University, Shenyang 110004, China; (2) Cold Rolling Mill, Baoshan Iron and Steel Co. Ltd., Shanghai 201900, China; (3) School of Mechanical and Production Engineering, Nanyang Technological University, Singapore 639798, Singapore |
| Abstract: | The composition of chromate passive film deposited on commercial tinplate via a cathodic dichromate treatment was examined with X-ray photoelectron spectroscopy (XPS). The elements Cr, O and Sn are confirmed in the film together with a certain C as amount of contaminant. The thickness of the passivation layer is found about 20 nm. Narrow scan was carried out for the film's phase composition and showed that it consists mainly of Cr(OH) |
| Keywords: | X-ray photoelectron spectroscopy tinplate passive film survey scan narrow scan |
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