| Discussion on the relationship between Δ V_(EB) and I_E presented in thermal resistance standard IEC60747-7 Version 2000 |
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| 引用本文： | MIAO Qinghai *,MIAO Yuan ,ZHU Yangjun ,ZHANG Xinghua ,YANG Lieyong ,YANG Zhiwei ,ZHANG Dejun ,CHEN Fengxia and LU Shuojin .Discussion on the relationship between Δ V_(EB) and I_E presented in thermal resistance standard IEC60747-7 Version 2000[J].自然科学进展(英文版),2005(4). |
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| 作者姓名： | MIAO Qinghai * MIAO Yuan ZHU Yangjun ZHANG Xinghua YANG Lieyong YANG Zhiwei ZHANG Dejun CHEN Fengxia and LU Shuojin |
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| 作者单位： | 1. School of Physics and Microelectronics，Shandong University，Jinan 250100，China; 2. School of Electrical and Electronic Engineering，Nanyang Technological University，Singapore; 3. The 13th Research Institute，CETC，Shijiazhuang 050051，China |
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| 基金项目： | SupportedbytheNationalNaturalScienceFoundationofChina (GrantNo .60 4760 3 9) |
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| 摘 要： | ThethermalresistancestandardinIEC74 7 7iswidelyacceptedandhasbeenusedtillnow .Itwaspublishedin 1988,andconfirmedin 1994and 2 0 0 0 ,respectively .ThethermalresistancestandardinGB/T 4 5 87 94ofChina1] wasbasedontheIEC 74 7 72 ] .TheBSIEC 6 0 74 7 7:2 0 0 0 3] ofUnitedKing domalsocamefromtheIEC 74 7 7.Fig .1(a)showsthecorrespondingFigs . 2 3and 2 4inIEC 74 7 7.Fig .2 3hastwoI Vcurves ,whichareI Vcurvesoftheemittercurrent (IE)andemitter basevoltage(VEB)atthejunctiontemperaturesT(…
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