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场致发射硅尖阵列的研制
引用本文:吴海霞,仲顺安,李文雄,邵雷,鲁雪峰.场致发射硅尖阵列的研制[J].北京理工大学学报,2003,23(5):638-640.
作者姓名:吴海霞  仲顺安  李文雄  邵雷  鲁雪峰
作者单位:北京理工大学,信息科学技术学院电子工程系,北京,100081
基金项目:国家部委预研基金;YJ961031;
摘    要:研究真空微电子器件场致发射硅尖阵列的制作工艺.利用HNA湿法腐蚀工艺制作场致发射硅尖阵列,比较带胶腐蚀与不带胶腐蚀的不同.采用氧化削尖技术对硅尖进行锐化处理.制作了50×60硅尖阵列,同时给出了硅尖阵列的I-V特性.利用HNA湿法腐蚀制备的硅尖结构与理论分析一致,锐化处理改善了硅尖阴极阵列的场致发射特性.

关 键 词:真空微电子器件  湿法腐蚀  场致发射阴极阵列  硅尖
文章编号:1001-0645(2003)05-0638-03
收稿时间:2003/1/15 0:00:00
修稿时间:2003年1月15日

Preparation of Field-Emission Silicon Tip Arrays
WU Hai xi,ZHONG Shun an,LI Wen xiong,SHAO Lei and LU Xue feng.Preparation of Field-Emission Silicon Tip Arrays[J].Journal of Beijing Institute of Technology(Natural Science Edition),2003,23(5):638-640.
Authors:WU Hai xi  ZHONG Shun an  LI Wen xiong  SHAO Lei and LU Xue feng
Institution:Department of Electronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China;Department of Electronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China;Department of Electronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China;Department of Electronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China;Department of Electronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China
Abstract:Studies the process of preparation of field emission silicon tip arrays for use in vacuum microelectronic devices. By way of HNA wet chemical etching, field emission silicon tip arrays were prepared and the difference between etching with and without glue made out. The silicon tips were sharpened by means of oxidation sharpening. A 50×60 array of silicon tip was prepared and SEM images of silicon tips were made. Current vs. voltage characteristics of the silicon tip arrays were also observed. Structure of silicon tips prepared with HNA wet chemical etching was in agreement with that from theoretical analysis. Oxidation sharpening did improve the field emission characteristics of silicon tip arrays.
Keywords:vacuum microelectronic devices  wet etching  field-emission cathode array  silicon-tip
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