| 测量透明颗粒形状及变形的显微干涉系统 |
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| 引用本文： | 赵兵,方如华.测量透明颗粒形状及变形的显微干涉系统[J].同济大学学报(自然科学版),2004,32(12):1627-1630. |
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| 作者姓名： | 赵兵 方如华 |
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| 作者单位： | 1. 同济大学,固体力学教育部重点实验室,上海,200092
2. 同济大学,固体力学教育部重点实验室,上海,200092;同济大学,航空航天与力学学院,上海,200092 |
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| 摘 要： | 结合激光干涉及图像处理技术研究测量透明颗粒形状及监测其变形的光学系统 ;对共路偏光干涉仪进行改进 ,使之更好地测量由温度场变化引起的小试件变形 ;对柱及球形试件进行理论和数值分析及实验研究 .
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| 关 键 词： | 偏光干涉仪 透明颗粒 共路干涉 图像处理 显微 |
| 文章编号： | 0253-374X(2004)12-1627-04 |
Microscopic Interferometry for Transparent Grain Shape and Deformation Measurement |
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| ZHAO Bing,FANG Ru-hua.Microscopic Interferometry for Transparent Grain Shape and Deformation Measurement[J].Journal of Tongji University(Natural Science),2004,32(12):1627-1630. |
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| Authors: | ZHAO Bing FANG Ru-hua |
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| Abstract: | A technique combining image processing and laser interferometry for measuring transparent grain shape and detecting its deformation is proposed.A common-path polarizing interferometer is developed for the sample deformation detection.A theoretical and numerical analysis of the spherical and cylindrical samples is carried out.The result is in good agreement with the experimental data. |
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| Keywords: | polarizing interferometer transparent grain common path image processing microscopy |
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