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| 基于CMOS图像光栅传感器的位移测量系统的实现 | |
| 引用本文： | 杨军平,吴欣慧,秦长海. 基于CMOS图像光栅传感器的位移测量系统的实现[J]. 科技信息, 2010, 0(5): 98-99 |
| 作者姓名： | 杨军平 吴欣慧 秦长海 |
| 作者单位： | 安阳工学院电子信息与电气工程系; |
| 摘 要： | 目前在科技研究、工业生产等各行业中，对于位移的高精度测量都是不可或缺的。利用光栅传感器完成测量是目前的主要方法。光栅传感器利用光电转换的原理将位移转换为电信号，该信号经过整形、细分后输出给后级电路完成对信号的处理，最后得到位移大小方向。本文在分析光栅传感器工作原理的基础上，提出借助CMOS图像传感器代替传统的硅光电池检测莫尔条纹，完成信号的细分，实现对位移的高精度测量。文中介绍了整体电路的设计和单片机系统的硬件及软件流程。 |
| 关 键 词： | CMOS图像传感器 光栅传感器 测量 |
The Design of Displacement Measurement System Based on CMOS Image Sensors in Grating Sensors |
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| YANG Jun-ping WU Xin-hui QIN Chang-hai. The Design of Displacement Measurement System Based on CMOS Image Sensors in Grating Sensors[J]. Science, 2010, 0(5): 98-99 | |
| Authors: | YANG Jun-ping WU Xin-hui QIN Chang-hai |
| Affiliation: | Department of Electronic Information and Electrical Engineering/a>;An yang Institute of Technology/a>;Anyang Henan/a>;455000/a>;China |
| Abstract: | The precision measurement of displacement is necessary in scientific research and industry.At present,the main way is by grating sensors.The Geometries of displacement are converted to electric signal by grating sensors through photo-electro conversion.This signal is sent to circuit after shaping and subdivision,the quantity and direction of displacement are acquired at last.Based on the analysis of working principle of grating sensor,this paper gives a new method to detect displacement with high accuracy.I... |
| Keywords: | CMOS Image Sensors Grating Sensors Measurement |
| 本文献已被 CNKI 维普 等数据库收录！ | |