| 一种基于电压控制的扫描测试功耗优化方法 |
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| 引用本文： | 张红南,文跃荣,邓 榕.一种基于电压控制的扫描测试功耗优化方法[J].湖南大学学报(自然科学版),2011,38(1):40-43. |
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| 作者姓名： | 张红南 文跃荣 邓 榕 |
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| 作者单位： | 1. 湖南大学,物理与微电子科学学院,湖南,长沙,410082
2. 长沙大学,电子与通信工程系,湖南,长沙,410003 |
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| 基金项目： | 湖南省自然科学基金资助项目(851204013) |
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| 摘 要： | 提出了一种通过电压控制来实现扫描测试低功耗优化的方法(压控法).该方法主要采用插入门控晶体管来控制组合逻辑单元供电,从而有效地解决了在扫描测试移入过程中测试信号向组合逻辑的无用传播,由于组合逻辑的供电受到控制,因此压控法不仅有效降低了无用的动态功耗,同时也大大降低了由于供电所产生的漏电静态功耗.而且门控晶体管的插入对于...
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| 关 键 词： | 动态功耗 扫描测试 组合逻辑电路 测试信号 静态功耗 |
A Method for Scan Test Power Optimization Based on Voltage Control |
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| ZHANG Hong-nan,WEN Yue-rong,DENG Rong.A Method for Scan Test Power Optimization Based on Voltage Control[J].Journal of Hunan University(Naturnal Science),2011,38(1):40-43. |
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| Authors: | ZHANG Hong-nan WEN Yue-rong DENG Rong |
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| Institution: | ZHANG Hong-nan1,WEN Yue-rong1,DENG Rong2(1.College of Physics and Microelectronics Science,Hunan Univ,Changsha,Hunan 410082,China,2.College of Electronics and Communication Engineering,Changsha Univ,Hunan 410003,China) |
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| Abstract: | This paper proposed a method to accomplish scan test low-power optimization through voltage control.This method is named voltage-control method for short.It controls the power supply of combination logical units mainly through gating transistor insertion.It effectively solves the problem of the useless propagation to combination logic from test signals in the process of the shift-in of scan test.The power supply of combination logic is controlled,thus the voltage-control method not only effectively reduces ... |
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| Keywords: | dynamic power scan test combination logic circuit test signals static power |
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