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金属/非晶硅势垒低频电容中等价的隙态密度分布
引用本文:唐元洪.金属/非晶硅势垒低频电容中等价的隙态密度分布[J].湖南大学学报(自然科学版),1990,17(4):35-41.
作者姓名:唐元洪
作者单位:湖南大学应用物理系
摘    要:本文证明:在一定条件下,描述非晶硅隙态密度分布的三种基本函数,即均匀分布、指数分布和双曲分布,在计算金属/非晶硅势垒低频电容时也是等价的.并通过测量室温时低频势垒电容,得到了隙态密度分布函数模型等价的标准.

关 键 词:非晶硅  半导体  电容  测量  隙态密度

The Equivalent Distribution of Gap State Density in Low Frequency Capacitance of M/a-Si Barrier
Tang Yuanhong.The Equivalent Distribution of Gap State Density in Low Frequency Capacitance of M/a-Si Barrier[J].Journal of Hunan University(Naturnal Science),1990,17(4):35-41.
Authors:Tang Yuanhong
Institution:Tang Yuanhong Department of Applied Physics
Abstract:In this paper we demonstrate that under certain conditions the three basic distribution function models to describe the gap state density of amorphous silicon (a-Si), i.e. uniform distribution, exponential distribution and hyperbolic distribution are also equivalent in calculating low frequency capacitance of Metal/a-Si barrier. An equivalence standard of distribution function models of gap state density is obtained by measuring the low frequency capacitance of Metal/a-Si in room temperature.
Keywords:amorphous semiconduductor  distribution function  capacitance measurement/gap state density
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