| 分形分析1/f噪声性能 |
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| 引用本文： | 陈晓娟,唐龙泳,隋吉生,吴洁.分形分析1/f噪声性能[J].河南科技大学学报(自然科学版),2012(1):28-31,6. |
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| 作者姓名： | 陈晓娟 唐龙泳 隋吉生 吴洁 |
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| 作者单位： | 东北电力大学信息工程学院 |
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| 基金项目： | 吉林省自然科学基金项目(20101519) |
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| 摘 要： | 电子器件的低频噪声通常由闪烁(1/f噪声)噪声、g-r噪声和爆裂噪声3种成分构成。这些噪声通常与晶体管表面状态或内部缺陷有关,其中,1/f噪声已成为对器件的质量评估及可靠性预测的重要指标。提出分形分析方法,对1/f噪声性能进行分析。仿真实验结果验证了该方法的可行性,为今后用分形理论研究器件低频噪声提供了理论依据。
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| 关 键 词： | 低频噪声 1/f噪声 分形分析 |
Fractal Analysis of 1/f Noise Performance |
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| CHEN Xiao-Juan,TANG Long-Yong,SUI Ji-Sheng,WU Jie.Fractal Analysis of 1/f Noise Performance[J].Journal of Henan University of Science & Technology:Natural Science,2012(1):28-31,6. |
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| Authors: | CHEN Xiao-Juan TANG Long-Yong SUI Ji-Sheng WU Jie |
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| Institution: | (College of Information Engineering,University of Northeast Dianli,Jilin 132012,China) |
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| Abstract: | Low frequency noise of electronic device usually consists of 1/f noise,g-r noise and burst noise.They are usually related to transistor surface condition or internal defects.1/f noise has been become an important index in the device of quality assessment and reliability prediction.According to its irregular and singularity everywhere,this paper adopts fractal analysis method to analyze 1/f noise’ s performance.The simulation results show that this method can be used effectively in device reliability analysis. |
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| Keywords: | Low frequency noise 1/f noise Fractal analysis |
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