| 适用于电子器件寿命测试的威布尔分布函数的导出 |
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| 引用本文： | 孙振东,王喜山.适用于电子器件寿命测试的威布尔分布函数的导出[J].烟台大学学报(自然科学与工程版),1992(Z1). |
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| 作者姓名： | 孙振东 王喜山 |
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| 作者单位： | 烟台大学
(孙振东)，青岛大学(王喜山) |
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| 摘 要： | 本文在拉应力、电应力为变量的威布尔分布函数的基础上.从三个角度分析并导出了寿命试验和加速寿命试验中以时间为自变量的威布尔分布函数.已证明它与实验吻合并可用于测量电子器件寿命。
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| 关 键 词： | 威布尔分布函数 |
The Deduction of Weibull Function Suited for Lifetime Test of Electronic Devices |
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| Sun Zhendong,Wang Xishan.The Deduction of Weibull Function Suited for Lifetime Test of Electronic Devices[J].Journal of Yantai University(Natural Science and Engineering edirion),1992(Z1). |
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| Authors: | Sun Zhendong Wang Xishan |
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| Institution: | Sun Zhendong Wang Xishan
(Yantai University) (Qingdao University) |
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| Abstract: | In this paper Weibull functions with mechanical and electrical stress variables was introduced. Another Weibull function with time variable on ordinary and accelerated life tests was obtained. It had been proved by the author that this function is congruous with the tests and it can be used in lifetime tests of electronic devices. |
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| Keywords: | Weibull function |
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