| 铁电薄膜开关特性测量 |
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| 引用本文： | 曾亦可,厉媛玥,绕韫华,刘梅冬.铁电薄膜开关特性测量[J].华中科技大学学报(自然科学版),1999,27(6):10-12. |
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| 作者姓名： | 曾亦可 厉媛玥 绕韫华 刘梅冬 |
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| 作者单位： | 华中理工大学电子科学与技术系 |
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| 基金项目： | 国家高技术研究发展计划资助 |
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| 摘 要： | 对铁电薄膜的开关特性进行了分析．介绍了利用美国ＨＰ４１９２Ａ低频阻抗分析仪设计铁电薄膜开关特性测量仪的方法．讨论了测量原理以及如何利用测量仪所产生的双极性双脉冲对铁电薄膜的开关特性进行测量，给出了有关ＰＺＴ（５５／４５）铁电薄膜样品的测量结果
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| 关 键 词： | 铁电薄膜 开关特性 测量 双极性双脉冲 |
| 修稿时间： | 1998-12-02. |
Measurement for Switching Characteristics of Ferroelectric Thin Films |
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| Zeng Yike,Li Yuanyue,Rao Yunhua,Liu Meidong.Measurement for Switching Characteristics of Ferroelectric Thin Films[J].JOURNAL OF HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY.NATURE SCIENCE,1999,27(6):10-12. |
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| Authors: | Zeng Yike Li Yuanyue Rao Yunhua Liu Meidong |
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| Abstract: | The switching characteristics of ferroelectric
thin films are analyzed. The ways and means are described utilizing American HP4192A LF
Impedance Analyzer to design a measuring instrument of switching characteristics with
ferroelectric thin film. The measuring principle and the use of bipolar double pulse generated by
measuring instrument for measuring switching characteristics with ferroelectric thin films are
discussed. Measurement result of the samples of PZT(55/45) ferroelectric thin films is given. |
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| Keywords: | ferroelectric thin films swithching characteristics measurement bipolar double pulse |
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