| OLED电极引线的腐蚀机理分析 |
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| 引用本文： | 彭雅芳,俞宏坤,蒋益明,余峰,张积梅.OLED电极引线的腐蚀机理分析[J].复旦学报(自然科学版),2008,47(6). |
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| 作者姓名： | 彭雅芳 俞宏坤 蒋益明 余峰 张积梅 |
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| 作者单位： | 1. 复旦大学,材料科学系,上海,200433
2. 上海广电电子股份有限公司,上海,200081 |
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| 基金项目： | 国家自然科学基金，科技部专项基金，上海市重点学科建设项目 |
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| 摘 要： | 有机电致发光器件(OLED)电极引线发生腐蚀是OLED失效的重要原因.用XRD,XPS,SEM和EDX等方法对镀Cr的ITO电极引线样品的腐蚀产物成分、结构和形貌进行了分析,XRD和XPS结果表明镀层Cr反应生成Cr(OH)3和CrO3,SEM和EDX结果表明Cr先腐蚀,ITO随后发生腐蚀.然后通过对引线样品在不同溶液中的极化曲线分析,得知Cr腐蚀产物的价态与其所处的电位有关,且氯离子对ITO腐蚀具有促进作用.最后根据实验结果对电极引线腐蚀的全过程提出一简化模型进行解释.
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| 关 键 词： | 有机电致发光器件 铬镀层 氧化铟锡玻璃 电极引线腐蚀 |
Corrosion Mechanism of Leads of OLED |
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| PENG Ya-fang,YU Hong-kun,JIANG Yi-ming,YU Feng,ZHANG Ji-mei.Corrosion Mechanism of Leads of OLED[J].Journal of Fudan University(Natural Science),2008,47(6). |
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| Authors: | PENG Ya-fang YU Hong-kun JIANG Yi-ming YU Feng ZHANG Ji-mei |
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| Abstract: | Lead corrosion of organic light emitting diodes is an important cause of OLED device failure.The corrosion product of Cr-coated ITO leads was characterized by using X-ray diffraction(XRD),X-ray photoelectron spectroscopy(XPS),scanning electron microscopy(SEM) and energy dispersion X-ray(EDX) methods.The results of XRD and XPS showed that Cr coat was eroded first to form the products Cr(OH)3 and CrO3 while the results of SEM and EDX indicated that ITO was eroded subsequently.Analysis of the polarization curves of lead samples in various solutions showed the valences of Cr in the corrosion product depends on its potential meanwhile Cl-could accelerate the corrosion reaction of ITO.A simplified model was suggested accordingly to explain the whole process of lead corrosion. |
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| Keywords: | organic light emitting device(OLED) Cr coat indium tin oxide(ITO) lead corrosion |
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