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波片厚度的双光路对比测量
引用本文:倪志波,宋连科,刘建苹,郑萌萌,王静.波片厚度的双光路对比测量[J].曲阜师范大学学报,2007,33(4):63-64,72.
作者姓名:倪志波  宋连科  刘建苹  郑萌萌  王静
作者单位:[1]曲阜师范大学激光研究所 [2]曲阜师范大学物理工程学院,山东省曲阜市273165
摘    要:介绍了一种测量波片厚度的新方法.根据偏振光干涉的理论分析,推导出了计算波片厚度的解析式.在此基础上,设计、建立了一套双光路对比测试光强的实验系统.利用该实验系统对含有待测石英薄片的光路进行多次测量,将实验数据用推导出的波片厚度计算公式处理,得到了待测薄片的厚度.

关 键 词:波片  线偏振光  延迟量  厚度
文章编号:1001-5337(2007)04-0063-03
修稿时间:2006-12-01

The Measurement of Wave Plate Thickenss by Double Beam Path
NI Zhi-bo,SONG Lian-ke,LIU Jian-ping,ZHENG Meng-meng,WANG Jing.The Measurement of Wave Plate Thickenss by Double Beam Path[J].Journal of Qufu Normal University(Natural Science),2007,33(4):63-64,72.
Authors:NI Zhi-bo  SONG Lian-ke  LIU Jian-ping  ZHENG Meng-meng  WANG Jing
Institution:1.Laser Research Institution; 2. School of Physics and Technology, Qufu Normal University, 273165, Qufu, Shangdong, PRC
Abstract:A new method to measurement the thickness of wave plate is introduced. According to the interference theory of polarized light, the formula of wave plate thickness are deduced. Basing on this, an experimental measurement system with double beam path is designed and established. The quartz wave plate for several times with this system is measured. Using the experiment result and theoretical formula, the thickness of the wave plate is figured out .
Keywords:wave plate  linearly polarized light  retardation  thickness
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