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用OCV细分干涉条纹技术的研究
引用本文:任明善,朱长纯.用OCV细分干涉条纹技术的研究[J].西安交通大学学报,1991,25(1):199-222,118.
作者姓名:任明善  朱长纯
作者单位:西安交通大学物理系 (任明善),西安交通大学电子工程系 (朱长纯),西安交通大学电子工程系(万长虹)
摘    要:本文介绍了一种采用光控变容二极管来细分干涉条纹技术。光控变容二极管(OVC)是一种新型半导体器件。用计算机系统采集并处理数据,能够计数和细分干涉条纹,并已获得较高的灵敏度(超过1/90条)。该技术的优点在于它的可靠性,经济性、简单而且速度高。

关 键 词:OCV  细分  干涉条纹  光电探测器

THE STUDY OF THE FINE DIVIDING TECHNIQUE FOR UNITY INTERFERENCE FRINGE BY USING OCV
Ran Mingshan,Zhu Changchun,Wan Changhong.THE STUDY OF THE FINE DIVIDING TECHNIQUE FOR UNITY INTERFERENCE FRINGE BY USING OCV[J].Journal of Xi'an Jiaotong University,1991,25(1):199-222,118.
Authors:Ran Mingshan  Zhu Changchun  Wan Changhong
Institution:Ran Mingshan;Zhu Changchun;Wan Changhong Department of physics Department of Electronic Engineering
Abstract:A new technique of fine dividing interference fringe by an optically controlled varactor is reported in this paper. The optically controlled varactor (OCV) is a new semiconductor device. Counting and dividing interference fringe have reached higher sensitivity (over 1/90 fringe) by using computer system for collecting and treating date. The advantages of this technique are reliability, economy, simpleicity and high-speed.
Keywords:interference  photon detectors  varactor  precision  fine dividing
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