多峰分布的微粒粒度衍射测量方法的改进

针对多峰分布微粒粒度衍射测量中,Chin-Shifrin积分变换反演噪声较大而易被误读为分布峰的问题,提出了一种插入函数方法,模拟计算结果证明了该方法的可行性。以线阵CCD为接受器件,对双峰、三峰及四峰分布的微粒系进行了实验测量,结果显示:采用插入函数后反演噪声基本消失,而原分布峰的个数及位置均不受影响。说明该方法可以较准确地还原原分布。反演的结果还指出可通过增加物镜焦距来避免反演谱尾部上翘现象,但也可能导致大角的数据丢失引起其他问题,在实际测量中必须采用恰当的焦距,才能达到满意的效果。

Improved method for diffraction measurement of particle size with multi-peaks distribution

In the diffraction measurement of particle size with multi-peaks distribution, the Chin-Shrine integral transform inversion noises are easily misread as actual distribution peaks. To solve this problem, an improved method of inserting function was proposed. Simulation results demonstrated the feasibility of this method. The improved method was tested to measure particle sizes with two peaks, three peaks and four peaks distribution by using linear CCD detector array. The results show that, using inserting function, the noises almost totally disappear, while the number and locations of the original distribution peaks are not affected. Therefore, this method accurately restores the original distribution. The results also show that increase in the focal length can avoid the stuck-up of the inversion spectrum tail. However, it may induce the loss of data in large angle and other problems. Good measurement results can be achieved by selecting suitable focal length.